In-Sight Explorer Wafer ID 4.5.2 [Download]

Download In-Sight Explorer Wafer ID 4.5.2 for various usability enhancements and fixes.

In-Sight Explorer Wafer ID 4.5.2 is the latest release after In-Sight Explorer Wafer ID 4.5.0 CR3 for the In-Sight 1720 and In-Sight 1740 series wafer readers.

Enhancements and Fixes

• The Visual Basic 6.0 and Visual Basic .NET sample applications included with the Cognex Wafer ID installation now function properly. Previously, the sample applications did not function properly due to missing file dependencies.
• When embedding the Wafer ID user interface into a dialog in a custom application using a WebBrowser control, the application no longer enters an infinite loop when focus is restored to the application.
• When embedding the Wafer ID user interface into a custom application using a WebBrowser control, unhandled exception errors are no longer displayed when saving a job file or triggering the wafer reader.
• Modifying the Light Power value no longer causes the user interface to become unresponsive. Previously, quickly moving the horizontal scroll bar between a wide range of exposure values or repeatedly clicking the Light Power numeric up/down control could cause the interface to become temporarily unresponsive.
• When logged on to a wafer reader from Microsoft® Internet Explorer 7.0, after clicking the Tune button, the user interface stays connected to the reader and Internet Explorer. Previously, clicking the Tune button would cause an Internet Explorer error message to be displayed and the web browser to become unresponsive.
• Updated the Barcode Compression drop-down list on the Advanced tab to include Compression 10 and Compression 13 options for decoding compressed BC 412 barcodes. When Compressed 10 is the selected compression type, the &ldquo10&rdquo encoded value returns &ldquoVF&rdquo. When Compressed 13 is the selected compression type, the &ldquo13&rdquo encoded value returns &ldquoZF&rdquo.
• Updated the Advanced tab to include a Remove SEMI Checksum checkbox. When checked, the 2-character SEMI checksum and any "special" character immediately preceding the checksum ("-", ".", "#" or space)  is automatically removed from the read result. Added the SetConfigRemoveSEMIChecksum Extended Native Mode command to specify whether the SEMI checksum is automatically removed from the read result and added the GetConfigRemoveSEMIChecksum Extended Native Mode command to retrieve the current setting. This feature is supported for 'SEMI, M1.15' and 'Chars' mark types when the Checksum is 'SEMI' or 'SEMI with Virtual'.
• If a job file is developed on an In-Sight 1720 wafer reader and then loaded onto an In-Sight 1740 wafer reader, the image orientation will be inverted. To automatically adjust the image orientation on the In-Sight 1740 wafer reader without making changes to the job file, you must send the following Extended Native Mode command to the In-Sight 1740 wafer reader: EV SetSystemConfig("IS1720ImageCompatibility",1,1). This command is only supported on the In-Sight 1740 wafer reader.
• After tuning a filter for a Config, "Auto" filter operations will no longer be reset to zero if the user clicks the Edit or Done buttons on the Filter tab.
• The status bar is now properly displayed in Internet Explorer when the user interface language is set to Japanese. Previously, the status bar would not be displayed in its entirety.
• Note: This fix was made to the Index.html file that is included in the Wafer ID installation package. The Index.html file must be copied to the wafer reader's flash memory via FTP to access this fix.
• When executing the In-Sight Protocol READ command to trigger the wafer reader, the Output Time now returns the correct read execution time for all enabled Configs. Previously, the Output Time could be different from the read execution time displayed in the Wafer ID user interface.

File Name: Cognex In-Sight Wafer ID 4.5.2 .zip