Content Summary
Release 4.5.0 CR3 updates firmware/software for In-Sight 1720 and 1740 wafer readers, addressing issues from version 4.5.0. Key changes include a new 'Chars, Canon' mark type for Canon font OCR on the General tab, improved handling of enabled Configs with respect to Timeout limits, and accurate display of read time in Read Log when retry tuning is executed for multiple Configs. Download the update as In-Sight Wafer ID 4.5.0 CR3 .zip.
Release 4.5.0 CR3 is a patch release of firmware/software for all In-Sight 1720 series and In-Sight 1740 series wafer readers. This release contains changes and fixes to known issues in firmware/software version 4.5.0.
Changes and Fixes
- Added a 'Chars, Canon' mark type to the General tab to allow for reading Canon font OCR marks.
- When a read is executed, the wafer reader now properly attempts to read the mark for all enabled Configs until the Timeout limit is reached. Previously, all enabled Configs were tried, but the Timeout value was ignored.
- If Tune is selected from the Retry drop-down for more than one enabled Config, then a read is executed and retry tuning automatically occurs, the Read Log's overall read time (in seconds) now displays the correct time it took to perform the read.
File Name: In-Sight Wafer ID 4.5.0 CR3 .zip